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Z-Trak 3D Apps Studio Download

Model: z-trak-3d-apps-studio
product image

In Production

Z-Trak 3D Apps Studio Overview

 

Z-Trak 3D Apps Studio

Z-Trak™ 3D Apps Studio is a suite of software tools developed for in-line 3D measurement applications. These 3D tools are developed to work with Teledyne DALSA’s Z-Trak family of 3D laser profilers to simplify 3D inspection and dimensional measurement tasks on the factory floor.

 

Key Features

  • New 3D tools for defect inspection on flat, curved, round or extruded parts
  • 3D thickness measurement tool
  • 3D bead profile tool delivers critical dimension and location data
  • Reflection elimination tool for improved measurements
  • Preserve data integrity when working with data from multiple sensors
  • Simultaneous acquire and process 3D scans and 2D reflectance data
  • Expanded set of fully documented reference examples and programs
 
 

Z-Trak 3D Apps Studio Examples

Application: PCB Inspection

  • Identify parts based on the position and height data
  • Read character strings from PCB silk screened text
  • Remove un-wanted reflections from sections
  • Dynamic height thresholding to identify components

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Z-Trak 3D Apps Studio Pipe Image

Application: Pipe Inspection

  • Inspect surfaces of extruded pipes
  • Identify dents and bumps meeting specified criteria
  • Combine data from multiple sensors in a ring layout
  • Remove un-wanted reflections from specific sections
 

Application: Glue Bead Inspection

  • Inspect the profile of a bead for shape and size
  • Locate and measure critical bead dimensions
  • Measure area/volume of the bead
  • Acquire and combine 3D profiles from multiple sensors positioned at +/- 45° from the center
  • Locate and correct tilt in the bead base.

Z-Trak 3D Apps Studio Glue

 

Z-Trak-3D-Apps-Studio-Lead-Frame-Inspection

Application: Lead Frame Inspection

  • Measure critical dimensions of microchip leads
  • Identify missing or bent leads
  • Minimize sensor count, while ensuring the highest resolution
  • Remove/reduce the effect of un-wanted reflections
  • Minimize processing time

Specifications

Type
Acquisition & Processing Application