VSD Article - Next-Gen Contact Image Sensors Enhance Inspection of Batteries and Printed Material

November 27, 2024

Contact image sensors are suitable for inspection and metrology tasks in spatially restricted machine vision environments.

Contact image sensors have come a long way. The latest generation of this technology provides higher speed, resolution, and dynamic range than its predecessor.

These improvements make contact image sensors (CIS) suitable for inspection and metrology tasks in spatially restricted machine vision environments, such as battery production and printing lines, where precision and efficiency are essential.

This article will examine the challenges of inspecting battery and print materials and how CIS technology offers an optimal solution. One advantage of CIS technology is its compact form factor compared to conventional line scan cameras. While conventional systems typically require a working distance of 250~500 mm, CIS operates within just 10~20 mm. This makes CIS ideal for use in spatially restricted in-line automatic optical inspection (AOI), which is essential for real-time, high-throughput quality control. CIS is also highly integrated, combining the camera, lens, and lighting into a single unit, which simplifies system design and speeds up installation. Due to these benefits, CIS is increasingly being adopted in machine vision applications.

Click here to read the full Vision Systems Design article by Teledyne DALSA's Xing-Fei He.